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Home
MSC Training Courses
NIST Seminars
Tutorial Workshops
Technical Sessions
Speakers
Tutorial Speakers
Technical Speakers
NIST Speakers
Keynote Speakers
Conference Details
Schedule
Pricing & Registration
Sponsors
Hotel & Travel
Scholarship Awards
Exhibits
Reserve a Booth
Exhibitor Map
About MSC
Presidents Message
Mission & History
Leadership & Commitees
Board of Directors
Committee
Past Presidents
MSC Genealogy
Resources
Blog
Woodington Award
Gallery
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Register
Register Today
All Events
Measurement Science Conference
>
Event
T17: RF Metrology: Fundamentals and Uncertainty Contributor Calculations – 1/2 Day
T08: GXP Metrology: A Strategic Approach to Biopharma Calibration Process Management – 1/2 Day
T09: 5560 User
T16: Hands-on Dimensional Calibration, focused on small tools like calipers and micrometers – 1/2 Day
T11: Holistic View of Measurement Quality and Decision Rules
Day - 01
02 05 26
8:00am - 12:00pm
T14: Metrology 101: Back to Basics – Full Day
Day - 01
02 03 26
-
T01: “The Book” on Resistance, from 0.1 micro Ohm through 100 TeraOhm Measurements – Full Day
T05: Test Uncertainty – The Revolution in Evaluating Measurement Uncertainty – 1/2 Day
N07: Force Sensor Calibrations and Measurements – 1/2 Day
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